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Protein Structure and Function Laboratory

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~2000

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Effect of growth interruption and the introduction of H2 on the growth of InGaN/GaN multiple quantum wells
  • AuthorYong-Tae Moon, Dong-Joon Kim, Keun-Man Song, Dong-Wan Kim, Min-Su Yi, Do-Young Noh, and Seong-Ju Park
  • Year2000
  • SourceJ. Vac. Sci. Technol. B, 18, 2631 (2000)

Formation of crystalline Ba-ferrite phase from alpha-Fe2O3 phase in amorphous precursor
  • AuthorTae Sik Cho, Jung Ho Je, and Do Young Noh
  • Year2000
  • SourceAppl. Phys. Lett. 76, 303 (2000)

Structural evolution of GaN during initial stage MOCVD growth
  • AuthorChong Cook Kim, Jung Ho Je, Min-Su Yi and Do Young Noh
  • Year1999
  • SourceMRS Proceedings 595 (1999)

Crystallization of amorphous precursor of Ba-ferrite film: a real-time synchrotron x-ray scattering study
  • AuthorSeok Joo Doh, Jung Ho Je, Do Young Noh, Tak Jean Moon
  • Year1999
  • SourceIEEE TRANSACTIONS ON MAGNETICS, 35(5), 2778-2780 (1999)

Coherence based contrast enhancement in x-ray radiography with a photoelectron microscope
  • AuthorY. Hwu, B. Lai, D. C. Mancini, J. H. Je, D. Y. Noh, M. Bertolo, G. Tromba, and G. Margaritondo
  • Year1999
  • SourceAppl. Phys. Lett. 75, 2377 (1999)

Structure Determination of Nanostructured Ni-Co Films by Anomalous X-ray Scattering
  • AuthorG. M. Chow, W. C. Goh, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, H. C. Kang, D. Y. Noh, C. K. Lin, and W. D. Chang
  • Year1999
  • SourceAppl. Phys. Lett. 75, 2503 (1999)

Effects of growth temperature on GaN nucleation layers
  • AuthorM. S. Yi, H. H. Lee, D. J. Kim, S. J. Park, D. Y. Noh, C. C. Kim, and J. H. Je
  • Year1999
  • SourceAppl. Phys. Lett. 75, 2187 (1999)

Use of Photoelectron Microscopes as X-ray Detectors for Imaging and Other Applications
  • AuthorY. Hwu, W.L. Tsai, B. Lai, D.C. Mancini, J.H. Je, D.Y. Noh, H.S. Youn, C.S. Hwang, F. Cerrina, W. Swiech, M. Bertolo, G. Tromba, G. Margaritondo
  • Year1999
  • SourceNuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 437(2-3), 516-520 (1999)

Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms
  • AuthorHsieh. H. H, Lu. M. J, Tsai. W. L, Lin. H. M, Goh. W. C, Lai. B, Je. J. H, Kim. C. K, Noh. D. Y, Youn. H. S, Tromba. G, Margaritondo. G
  • Year1999
  • SourceJ. Appl. Phys. 86, 4613 (1999)

Thickness dependence of the crystallization of Ba-ferrite films
  • AuthorT. S. Cho, S. J. Doh, J. H. Je, and D. Y. Noh
  • Year1999
  • SourceJ. Appl. Phys. 86, 195 8 (1999)
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