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Ultra-fast lattice / electron dynamics
Coherent X-ray diffraction imaging
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Members
Professor
Current Members
Alumni
Research
Ultra-fast lattice / electron dynamics
Coherent X-ray diffraction imaging
Nanoscale phenomena of surface and interface
Transition metal oxide phase transition phenomenon
Development and application of laser X-ray source
Laser matter interaction
publication
2011~current
2001~2010
~2000
Lecture
Equipment
PLS-2
In-house X-ray
CDI system
Laser system
Sputtering system
E-beam evaporation
RTA
Furnace
AFM
Optical Microscope
Community
Notice
gallery
News
Beam Time
Contact us
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2001~2010
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~2000
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논문명(출판명)
저자
출처
Structure Determination of Nanostructured Ni-Co Films by Anomalous X-ray Scattering
Author
G. M. Chow, W. C. Goh, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, H. C. Kang, D. Y. Noh, C. K. Lin, and W. D. Chang
Year
1999
Source
Appl. Phys. Lett. 75, 2503 (1999)
Effects of growth temperature on GaN nucleation layers
Author
M. S. Yi, H. H. Lee, D. J. Kim, S. J. Park, D. Y. Noh, C. C. Kim, and J. H. Je
Year
1999
Source
Appl. Phys. Lett. 75, 2187 (1999)
Use of Photoelectron Microscopes as X-ray Detectors for Imaging and Other Applications
Author
Y. Hwu, W.L. Tsai, B. Lai, D.C. Mancini, J.H. Je, D.Y. Noh, H.S. Youn, C.S. Hwang, F. Cerrina, W. Swiech, M. Bertolo, G. Tromba, G. Margaritondo
Year
1999
Source
Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 437(2-3), 516-520 (1999)
Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms
Author
Hsieh. H. H, Lu. M. J, Tsai. W. L, Lin. H. M, Goh. W. C, Lai. B, Je. J. H, Kim. C. K, Noh. D. Y, Youn. H. S, Tromba. G, Margaritondo. G
Year
1999
Source
J. Appl. Phys. 86, 4613 (1999)
Thickness dependence of the crystallization of Ba-ferrite films
Author
T. S. Cho, S. J. Doh, J. H. Je, and D. Y. Noh
Year
1999
Source
J. Appl. Phys. 86, 195 8 (1999)
The development and application of imaging EXAFS spectroscopy
Author
Hwu. Y, Tsai. W. L, Chang. L. W, Chen. C. H, Wu. C. C, Noh. D. Y, Je. J. H, Fecher. G. H, Bertolo. M, Berger. H
Year
1999
Source
Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, 38, 646-649 (1999)
Iron-Oxide Interlayer Existing in Ba-Ferrite/Sapphire(001) Films
Author
Tae Sik Cho, Seok Joo Doh, Jung Ho Je and Do Young Noh
Year
1999
Source
Jpn. J. Appl. Phys. 38 (1999)
Synchrotron X-ray Scattering Study of the Strain Evolution in Thin AlN/Sapphire(0001) Films
Author
Hyon Choi Kang, Sun Hee Seo and Do Young Noh
Year
1999
Source
Jpn. J. Appl. Phys. 38 (1999)
Nitridation of sapphire substrate and its effect on the growth of GaN layer at low temperature
Author
Jong-Sik Paek, Kyoung-Kook Kim, Ji-Myon Lee, Dong-Joon Kim, Min-Su Yi, Do Young Noh, Hyo-Gun Kim, Seong-Ju Park
Year
1999
Source
Journal of Crystal Growth, 200(1?2), 55?62 (1999)
Microstructure of epitaxial aFe2O3 grains in Baferrite thin films grown on sapphire (001)
Author
T. S. Cho, S. J. Doh, J. H. Je, and D. Y. Noh
Year
1999
Source
Appl. Phys. Lett. 74, 2050 (1999)
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